Transactions of Nonferrous Metals Society of China The Chinese Journal of Nonferrous Metals

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中國有色金屬學(xué)報

ZHONGGUO YOUSEJINSHU XUEBAO

第25卷    第6期    總第195期    2015年6月

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文章編號:1004-0609(2015)06-1648-07
化學(xué)氣相沉積鎢顯微組織缺陷的形成與控制
沈艷波1,于曉東1, 2,譚成文1, 2,王富恥1,馬紅磊2,才鴻年1

(1. 北京理工大學(xué) 材料學(xué)院,北京 100081;
2. 中國航天員科研與訓(xùn)練中心,北京 100081
)

摘 要: 以WF6為前驅(qū)體,采用化學(xué)氣相沉積法(CVD)在純銅基體上沉積出鎢涂層。利用光學(xué)顯微鏡(OM)和掃描電鏡(SEM)分析研究鎢制品組織缺陷的形成。結(jié)果表明:反應(yīng)物濃度起伏對化學(xué)氣相沉積鎢的顯微組織具有顯著影響。當(dāng)n(WF6):n(H2)≥1:3時,沉積物為柱狀晶組織;當(dāng)n(WF6):n(H2)<1:3時,該沉積層晶粒明顯細(xì)化,顯微組織為細(xì)晶層狀結(jié)構(gòu)。另外,沉積過程中雜質(zhì)形狀也顯著影響沉積層的顯微組織。當(dāng)基體表面存在一維雜質(zhì)時,沉積制品表面產(chǎn)生明顯的凸起,嚴(yán)重影響制品的表面質(zhì)量和顯微組織的均勻性;當(dāng)沉積過程中存在零維雜質(zhì)時,沉積層出現(xiàn)放射狀的組織結(jié)構(gòu)。

 

關(guān)鍵字: WF6;鎢;化學(xué)氣相沉積;反應(yīng)物濃度起伏;雜質(zhì)形狀;組織缺陷

Formation and control of microstructure defects of tungsten prepared by chemical vapor deposition method
SHEN Yan-bo1, YU Xiao-dong1, 2, TAN Cheng-wen1, 2, WANG Fu-chi1, MA Hong-lei2, CAI Hong-nian1

1. School of Material Science and Engineering, Beijing Institute of Technology, Beijing 100081, China;
2. China Astronaut Research and Training Center, Beijing 100081, China

Abstract:Tungsten coatings were deposited on pure copper substrates using WF6 as the precursor by chemical vapor deposition (CVD) method. The formation of the microstructure defects of the tungsten deposits was analyzed by OM and SEM. The results show that the reactant concentration fluctuation has a significant impact on the microstructure of tungsten prepared by CVD method. When n(WF6):n(H2)≥1:3, the microstructure of tungsten is columnar grain; when n(WF6):n(H2)<1:3, the grains of the deposited layer are refined and the microstructure presents a fine grains multilayer structure. Moreover, the shapes of the impurities can also influence significantly on microstructure of the layer. When there is one-dimensional impurity on the surface of substrate, the surface of deposition has obvious bulge, which seriously affects the deposits surface quality and microstructure uniformity; when there is zero dimensional impurity during the deposition process, the deposit appears radial structure.

 

Key words: WF6; tungsten; chemical vapor deposition; reactant concentration fluctuation; impurity shape; microstructure defect

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW

主管:中國科學(xué)技術(shù)協(xié)會 主辦:中國有色金屬學(xué)會 承辦:中南大學(xué)
湘ICP備09001153號 版權(quán)所有:《中國有色金屬學(xué)報》編輯部
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