(北京有色金屬研究總院， 北京 100088)
摘 要: 從X射線衍射強度的指數(shù)方程出發(fā)，考慮到1%的允許誤差，經(jīng)數(shù)學(xué)處理建立了微量薄膜樣品的質(zhì)量與衍射強度間的線性方程y=a+bIn; a, b值用被測物相純樣的外標曲線確定，線性方程的相關(guān)系數(shù)r=0.995， 從而建立了微量薄膜樣品的物相定量分析直接對比法。同時，建立了微量樣品和有限厚樣品間臨界值的實驗方法及有限厚樣品衍射強度的吸收校正方法。所建立的方法用于礦山呼吸性粉塵中α-SiO2的定量測定， 檢出下限達0.01 mg。
關(guān)鍵字: 微量樣品 物相定量分析 吸收校正 粉塵
（Beijing General Research Institute for Nonferrous Metals, Beijing 100088, P. R. China）
Abstract:The liner expressing equation correlating sample mass and the diffraction intensity, y=a+b In, was deduced mathematic ally from exponent equation of the X-ray diffraction intensity, with correlation coefficient r=0.995 and with one hundredth allowable error of quantitative phase analysis being taken into account. The values a and b are determined by an established calibration curve of measured phase. The direct contract method of quantitative phase analysis for trace-mass samples was established. The test method determining the critical values between the trace-mass samples and limited thickness samples and the absorption revision method of limited thickness samples were established. These methods have been used in determining the content of free silica of respirable dust and the evaluated limit can be downed to 0.01 mg.
Key words: trace-mass samples phase analysis absorption revision dust
