(北京有色金屬研究總院， 北京100088)
摘 要: 利用俄歇能譜、 X射線電子能譜和掃描電鏡對Cu-Al-Mg合金表面氧化膜進(jìn)行了分析。結(jié)果表明： 氧化膜由MgO和Al2O3組成；沒有進(jìn)行過氧化處理的樣品膜內(nèi)的Al和O含量高于進(jìn)行過氧化處理的樣品，而Mg則相反； Al2O3的鍵合能E2p3/2值大于MgO的E2p3/2值，表明Al2O3不易被分解；進(jìn)行電子轟擊后，膜內(nèi)Mg含量減少， MgO被部分分解，而Al則增加。 由MgO和Al2O3組成的復(fù)合型氧化膜使得合金既具有高的二次電子發(fā)射系數(shù)又有長的壽命，因此，Cu-Al-Mg合金是一種理想的二次電子發(fā)射材料。
關(guān)鍵字: Cu-Al-Mg合金； 表面分析； 二次電子發(fā)射材料
（Beijing General Research Institute for Nonferrous Metals, Beijing 100088, P.R.China）
Abstract:In order to clarify the mechanism of the secondary electron emission, the Cu-Al-Mg alloy surface was analyzed by Auger emission spectroscopy (AES), X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). AES analysis proved that the oxide film of mixed MgO and Al2O3 are deposited on the alloy surface. XPS proved that the bonding energy (E2p3/2) of Al is larger than that of Mg, which indicates that the bond strength of Al2O3 is stronger than that of MgO. SEM observation of the component change of oxide film after electron bombardment showed that MgO is partially decomposed. Therefore the mixed MgO and Al2O3 oxide film, deposited on the surface of Cu-Al-Mg alloy, is better than single oxide film in its structure, which presents better emission property for secondary electron. Al is considered as the critical factor for increasing Cu-Al-Mg alloy emission life.
Key words: Cu-Al-Mg alloy; surface analysis; secondary electron emission material
