Abstract:X-ray diffraction sidebands presented in Cu-Ti alloys have been investigated and sideband profile has been calculated on the basis of the static lattice wave theory. It is concluded that the sideband profile strongly depends on distribution of the modulated wavelength and symmetry of wave form. Diffuse distribution of wavelength is the main reason for sideband moving towards main reflection line, and in this case, the calculated results of the modulated wavelength are not precise by using Daniel-Lipson formula. Moreover,the sideband profile asymmetry is attributed to asymmetry distribution of the modulated wave forms. The calculted sideband profile is in good agreement with the experimental results, which indicates that the static lattice wave theory is successful in dealing with solute atom distribution in solid solution of alloys.

Key words: Cu-Ti alloy　X-ray diffraction　sidebands　static lattice wave theory