中國(guó)有色金屬學(xué)報(bào)(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 19 No. 6 December 2009 |
piezoelectric properties of SrBi2−χNdχNb2O9 (
LI Ya-wei(李亞巍)1, FENG Chu-de(馮楚德)2, M
（1. Key Laboratory of Polar Materials and Devices of Ministry of Education,
East China Normal University, Shanghai 200062, China;
2. Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China）
Abstract:SrBi2−χNdχNb2O9 (χ=0, 0.1, 0.2 and 0.4) bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method. The accurate position of Nd element in SrBi2−χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure (XAFS) technology. The partial substitution of Nd3+ for Bi3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2−χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2−χNdχNb2O9 ceramics. Meanwhile, the temperature coefficient of resonant frequency (TCF) decreases when Nd element partially replaces Bi element in SrBi2−χNdχNb2O9 ceramics.
Key words: bismuth layer-structured ferroelectrics; X-ray Rietveld method; synchrotron radiation XAFS; piezoelectric properties
